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Swept Test System

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Swept Test System


The Santec Swept Test System has been developed to streamline photonic testing, providing a complete solution where high-speed analysis, along with high resolution and accuracy are key. Combining one of Santec’s tunable lasers (TSL-510 or TSL-710) with a Santec optical power meter (MPM-200), a polarization control unit (PCU-100) and custom software, the complete Swept Test System optimizes WDL and PDL measurement for use in both R&D and production environments.

 

Overview

Overview

Using real-time referencing, while simultaneously acquiring output power from the tunable laser and the transmitted optical power through the DUT, the system provides high accuracy in WDL and PDL analysis. The Mueller Matrix method is used to generate fast PDL measurements.
A simplified system is available by combining a Santec Swept Processing Unit (SPU-100) and any basic power meter or photodetector, the resulting Swept Test System variant can be used for WDL measurements. Over-sampling and a rescaling algorithms are used to maximize testing throughput while maintaining measurement integrity. The system is particularly suited to transmission spectra characterization such as those required for DWDM components and High Q photonic devices. Rapid sweep and accurate measurement saves time and ensures the integrity and validity of your device characterization.

 

Features

Features
  • Real-time power referencing
    1. Accurate WDL/PDL characteristics measurement
    - High power repeatability <+/-0.02dB
    - High PDL repeatability +/-0.01dB
    2. Automatic normalization of laser source power
  • Rescaling algorithm
    1. High wavelength resolution and accuracy
    2. Reduced measurement time
  • Multi-channel measurement is available.
  • Supporting LabVIEW control software
    1. Convenient set up of measurement parameters
    2. Data analysis

 

 

Applications

Applications
  • Optical components and modules characterization
    - Tunable Filters, Interleavers, Fiber Bragg Gratings (FBGs), Couplers, Splitters, Isolators, Switches
    - WSS, Wavelength Blockers
    - DWDM components
  • Photonic material characterization
  • Optical spectroscopy

 

 

Configuration

Typical Configuration

1/Polarization Dependent Loss measurement

  • Tunable Laser TSL-510/TSL-710
  • Polarization controller santec PCU-100
  • Optical power meter santec MPM-200/Agilent 816xA/B, 774xA optical power meter

2/ Wavelength Dependent Loss measurement (MPM-200)

  • Tunable Laser TSL-510/TSL-710
  • Optical power meter santec MPM-200

3/ Wavelength Dependent Loss measurement (Any other power meter)

  • Tunable Laser TSL-510/TSL-710
  • Swept Processing Unit SPU-100
  • Optical power meter (Needs data logging function)

Software support

  • Agilent 816xA/B, 774xA optical power meter
  • Yokogawa AQ2200 series optical power meter
  • Photo detector

Other customs may be possible upon request. Please ask.

 

Measurement result

WDL (Wavelength Dependent Loss) Measurement

1. Measurement dynamic range
There two choices of TSL-510 model depending on desired output spectral characteristics, one with higher SNR and the other with higher peak power. Choice of laser will depend on the required dynamic range and spectral profile of measurement. The graphs below show the transmission spectra of a bandpass filter and a notch type filter, respectively. TSL with high SNR enables high dynamic range measurement especially for this type of notch filter with sharp stop band (ex. FBG filter or interleaver).

STS-510_BandpassFilterSTS-510_NotchFilter

2.Wavelength accuracy of measurement

TSL-510 can be equipped with an optional integrated wavelength monitor. The graph shows measurement examples when using TSL-510 with a wavelength monitor option. (Acetylene gas cell is used for wavelength reference.)

STS-510_Acetylene1 STS-510_Acetylene2

R Branch Absorption Wavelength [nm] * Santec Wavelength [nm] P Branch Absorption Wavelength [nm] * Santec Wavelength [nm]
13 1518.2131 1518.212 5 1528.01432 1528.015
11 1519.13686 1519.137 7 1529.1799 1529.180
9 1520.0860 1520.086 9 1530.3711 1530.371
7 1521.06040 1521.061 11 1531.5879 1531.588
5 1522.0603 1522.060 13 1532.83045 1532.830

* NIST Special Publication 260-133 2001 Edition

 

 

Specifications

Specifications
Parameter Unit Specifications Notes
open image / external link TSL-510 Type TSL-710
TypeA TypeB TypeC TypeD -
Dynamic Range for IL (typ.) dB 50 70 50 70 70 At Bandpass filter
30 70 30 70 70 At Notch filter
Absolute Wavelength Accuracy (typ.) pm +/-57 +/-5.2 +/-2.8 At 10nm/s
+/-63 +/-11.5 +/-8.4 At 40nm/s
Relative Wavelength Accuracy *1(typ.) pm +/-27 +/-3.7 +/-2.0 at 10nm/s
+/-33 +/-10.0 +/-7.6 At 40nm/s
Wavelength repeatability *2 pm +/-11 +/-1.5 +/-1.0 At 10nm/s
+/-13 +/-4.0 +/-3.0 At 40nm/s
Scan speed nm/s 1 to 100 0.5 to 100
Measurement time for IL (typ.) sec 4 *4, 5 at 40nm/s
Measurement time for IL/PDL (typ.) sec 18 *4, 5 at 40nm/s
Wavelength Resolution pm 1 0.1
Insertion Loss Accuracy (typ.) dB +/-0.02 0 to 20dB device IL
+/-0.03 20 to 40dB device IL
Insertion Loss Repeatability *2, *3 (typ.) dB +/-0.02
Insertion Loss resolution dB 0.01
PDL Accuraccy (typ.) dB +/-(0.02 + 3% of PDL) 0 to 20dB device IL
+/-(0.15 + 3% of PDL) 20 to 40dB device IL
PDL Repeatability *2, *3 (typ.) dB +/-0.01
PDL Resolution dB 0.01
Communication - USB (USB 2.0 High Speed) MPM-200/PCU-100/SPU-100
GP-IB (IEEE488.2) TSL-510 /710/MPM-200/PCU-100
OperatingTemperature degC 15 to 35
Operating humidity % <80 non condensing

All specifications are quoted after 1 hour warm-up period.
All specifications applies with santec optical power meter MPM-200.
*1 Temperature within 25ºC±5ºC
*2 Temperature within 25ºC±1ºC
*3 Does not include influence of connector.
*4 The measurement condition is within wavelength resolution 5pm, wavelength range 40nm for 1 channel.
*5 The Measurement dynamic range is up to 35dB

 
 

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