Swept Test System

Swept Test System

Swept Test System


The Santec Swept Test System has been developed to streamline photonic testing, providing a complete solution where high-speed analysis, along with high resolution and accuracy are key. Combining one of Santec’s power monitor output-equipped TSL series tunable lasers with a Santec optical power meter (MPM-210 or MPM-200), a polarization control unit (PCU-100) and custom software, the complete Swept Test System optimizes WDL and PDL measurement for use in both R&D and production environments.

Watch Demo

 

 

概要

Using real-time referencing, while simultaneously acquiring output power from the tunable laser and the transmitted optical power through the DUT, the system provides high accuracy in WDL and PDL analysis. The Mueller Matrix method is used to generate fast PDL measurements.
A simplified system is available by combining a Santec Swept Processing Unit (SPU-100) and any basic power meter or photodetector, the resulting Swept Test System variant can be used for WDL measurements. Over-sampling and a rescaling algorithms are used to maximize testing throughput while maintaining measurement integrity. The system is particularly suited to transmission spectra characterization such as those required for DWDM components and High Q photonic devices. Rapid sweep and accurate measurement saves time and ensures the integrity and validity of your device characterization.

 

特徴

  • Real-time power referencing
    1. Accurate WDL/PDL characteristics measurement
    – High power repeatability <±0.02dB
    – High PDL repeatability ±0.01dB
    2. Automatic normalization of laser source power
  • Rescaling algorithm
    1. High wavelength resolution and accuracy
    2. Reduced measurement time
  • Multi-channel measurement is available.
  • Supporting LabVIEW control software
    1. Convenient set up of measurement parameters
    2. Data analysis

 

 

アプリケーション

  • Optical components and modules characterization
    – Tunable Filters, Interleavers, Fiber Bragg Gratings (FBGs), Couplers, Splitters, Isolators, Switches
    – WSS, Wavelength Blockers
    – DWDM components
  • Photonic material characterization
  • Optical spectroscopy

 

 

構成系

構成例

1/Polarization Dependent Loss measurement

  • Tunable Laser TSL-710/TSL-550/TSL-510
  • Polarization controller santec PCU-100
  • Optical power meter santec MPM-200/Agilent 816xA/B, 774xA optical power meter

2/ Wavelength Dependent Loss measurement (MPM-200)

  • Tunable Laser TSL-710/TSL-550/TSL-510
  • Optical power meter santec MPM-200

3/ Wavelength Dependent Loss measurement (Any other power meter)

  • Tunable Laser TSL-710/TSL-550/TSL-510
  • Swept Processing Unit SPU-100
  • Optical power meter (Needs data logging function)

Software support

  • Agilent 816xA/B, 774xA optical power meter
  • Yokogawa AQ2200 series optical power meter
  • Photo detector

Other customs may be possible upon request. Please ask.

 

測定結果

WDL (Wavelength Dependent Loss) 測定

1. 80dB以上の高ダイナミックレンジ測定可能

santec波長可変光源TSLシリーズは、ASE光雑音を低減し90dB/0.1nm以上の非常に高い信号対雑音比を実現しながら、同時に+10dBm以上の高い光出力を維持しています。複数入力で高い消光比特性の測定が求められる高密度波長分割多重方式(DWDM)部品評価や波長選択スイッチ(WSS)などの次世代部品評価の場で威力を発揮します。下記は、それぞれバンドパスフィルタ(CWDMフィルタ)およびノッチフィルタ(FBG)の測定データです。

2. 高波長精度測定可能 +/-3pm

santec波長可変光源TSLシリーズは、標準で高機能な波長モニタを搭載しているため、高波長精度測定が可能です。数pmの高波長精度は、Acetylene (12C2H2 )gas cellの測定した波長をリファレンスとして確認しています。

 

3. 高波長分解能測定可能 <0.1pm

santec Swept Test Systemは、高密度波長分割多重方式(DWDM)部品評価や波長選択スイッチ
(WSS)などの次世代光コンポーネントだけでなく、High Q キャビティデバイスのような非常に狭いフィルタのWDL測定も、波長掃引によって高波長分解能で効率的に測定可能です。

 

仕様

Parameter
Unit
Specications
Notes
TSL-550
TSL-710
Type A
Type B
Wavelength Accuracy *1 (typ.) (Absolute)
pm
±16
±4.6
±2.4
At 10nm/s
±19
±7.2
±5.0
At 40nm/s
Wavelength Accuracy (typ.) (Relative)
pm
±9
±3.1
±1.6
At 10nm/s
±12
±5.7
±4.2
At 40nm/s
Wavelength Repeatability *2
pm
±6
±1.9
±1.0
At 10nm/s
±7
±3.5
±2.6
At 40nm/s
Scan Speed
nm/s
1 to 100
0.5 to 100
 
Dynamic Range for Insertion Loss (typ.)
dB
70
 
Dynamic Range for PDL (typ.)
dB
0 to 5
 
Measurement Time for IL (typ.)
sec
4
At 40nm/s *4, *5
Measurement Time for IL / PDL (typ.)
sec
14
At 40nm/s *4, *5
Wavelength Resolution
pm
1
0.1
 
IL Accuracy (typ.)
dB
±0.02
0 to 20dB Device IL
±0.03
20 to 40dB Device IL
IL Repeatability *2, *3 (typ.)
dB
±0.02(±0.01 (typ.))
 
IL Resolution
dB
0.001
 
PDL Accuracy (typ.)
dB
±(0.02 + 3% of PDL)
0 to 20dB Device IL
±(0.15 + 3% of PDL) (typ.)
20 to 40dB Device IL
PDL Repeatability *2, *3 (typ.)
dB
±0.01
 
PDL Resolution
dB
0.01
 
Communication
USB (USB 2.0 High Speed)
MPM-200 / PCU-100 / SPU-100
GP-IB (IEEE488.2)
TSL-550 / TSL-710 / MPM-200 / PCU-100
Operating Temperature
degC
15 to 35
 
Operating Humidity
%
< 80
non-condensing

* All specifications are quoted after 1 hour warm-up period.
All specifications applies with santec optical power meter MPM-200.
*1 Temperature within 25°C±5°C
*2 Temperature within 25°C±1°C
*3 Does not include influence of connector.
*4 The measurement condition is within wavelength resolution 5pm, wavelength range 40nm for 1 channel.
*5 Measurement dynamic range per scan is up to 35dB.

 

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