Swept Test System

Swept Test System

New! Swept Test System


The Santec Swept Test System has been developed to streamline photonic testing, providing a complete solution where high-speed analysis, along with high resolution and accuracy are key. Combining one of Santec’s tunable lasers (TSL-710, TSL-550 or TSL-510) with a Santec optical power meter (MPM-200), a polarization control unit (PCU-100) and custom software, the complete Swept Test System optimizes WDL and PDL measurement for use in both R&D and production environments.

Watch Demo

 

 

概要

Using real-time referencing, while simultaneously acquiring output power from the tunable laser and the transmitted optical power through the DUT, the system provides high accuracy in WDL and PDL analysis. The Mueller Matrix method is used to generate fast PDL measurements.
A simplified system is available by combining a Santec Swept Processing Unit (SPU-100) and any basic power meter or photodetector, the resulting Swept Test System variant can be used for WDL measurements. Over-sampling and a rescaling algorithms are used to maximize testing throughput while maintaining measurement integrity. The system is particularly suited to transmission spectra characterization such as those required for DWDM components and High Q photonic devices. Rapid sweep and accurate measurement saves time and ensures the integrity and validity of your device characterization.

 

特徴

  • Real-time power referencing
    1. Accurate WDL/PDL characteristics measurement
    – High power repeatability <±0.02dB
    – High PDL repeatability ±0.01dB
    2. Automatic normalization of laser source power
  • Rescaling algorithm
    1. High wavelength resolution and accuracy
    2. Reduced measurement time
  • Multi-channel measurement is available.
  • Supporting LabVIEW control software
    1. Convenient set up of measurement parameters
    2. Data analysis

 

 

アプリケーション

  • Optical components and modules characterization
    – Tunable Filters, Interleavers, Fiber Bragg Gratings (FBGs), Couplers, Splitters, Isolators, Switches
    – WSS, Wavelength Blockers
    – DWDM components
  • Photonic material characterization
  • Optical spectroscopy

 

 

構成系

構成例

1/Polarization Dependent Loss measurement

  • Tunable Laser TSL-710/TSL-550/TSL-510
  • Polarization controller santec PCU-100
  • Optical power meter santec MPM-200/Agilent 816xA/B, 774xA optical power meter

2/ Wavelength Dependent Loss measurement (MPM-200)

  • Tunable Laser TSL-710/TSL-550/TSL-510
  • Optical power meter santec MPM-200

3/ Wavelength Dependent Loss measurement (Any other power meter)

  • Tunable Laser TSL-710/TSL-550/TSL-510
  • Swept Processing Unit SPU-100
  • Optical power meter (Needs data logging function)

Software support

  • Agilent 816xA/B, 774xA optical power meter
  • Yokogawa AQ2200 series optical power meter
  • Photo detector

Other customs may be possible upon request. Please ask.

 

測定結果

WDL (Wavelength Dependent Loss) 測定

1. 測定ダイナミックレンジ

TSL-510にはSNRの違いによるHigh SN VersionとHigh Power Versionがあります。TSL-710はHigh SN Versionに該当します。バンドパスフィルタとノッチフィルタの透過特性を測定した結果を示します。High SN Versionを用いて測定した場合、特にノッチフィルタにて優れたダイナミックレンジを得ることが出来ます。(例 FBG フィルタやインターリーバー)

STS-510_BandpassFilterSTS-510_NotchFilter

2.測定波長精度

TSL-510には波長モニタを内蔵したオプションがあります。TSL-710は標準で波長モニタを搭載しています。波長モニタ内蔵オプション付きTSL-510を使用して測定した結果を示します。(Acetylene (12C2H2 )gas cellを波長リファレンスとして使用)

STS-510_Acetylene1 STS-510_Acetylene2

R Branch Absorption Wavelength [nm] * Santec Wavelength [nm] P Branch Absorption Wavelength [nm] * Santec Wavelength [nm]
13 1518.2131 1518.212 5 1528.01432 1528.015
11 1519.13686 1519.137 7 1529.1799 1529.180
9 1520.0860 1520.086 9 1530.3711 1530.371
7 1521.06040 1521.061 11 1531.5879 1531.588
5 1522.0603 1522.060 13 1532.83045 1532.830

* NIST Special Publication 260-133 2001 Edition

 

 

仕様

Parameter
Unit
Specications
Notes
TSL-550
TSL-710
Type A
Type B
Wavelength Accuracy *1 (typ.) (Absolute)
pm
±16
±4.6
±2.4
At 10nm/s
±19
±7.2
±5.0
At 40nm/s
Wavelength Accuracy (typ.) (Relative)
pm
±9
±3.1
±1.6
At 10nm/s
±12
±5.7
±4.2
At 40nm/s
Wavelength Repeatability *2
pm
±6
±1.9
±1.0
At 10nm/s
±7
±3.5
±2.6
At 40nm/s
Scan Speed
nm/s
1 to 100
0.5 to 100
 
Dynamic Range for Insertion Loss (typ.)
dB
70
 
Dynamic Range for PDL (typ.)
dB
0 to 5
 
Measurement Time for IL (typ.)
sec
4
At 40nm/s *4, *5
Measurement Time for IL / PDL (typ.)
sec
14
At 40nm/s *4, *5
Wavelength Resolution
pm
1
0.1
 
IL Accuracy (typ.)
dB
±0.02
0 to 20dB Device IL
±0.03
20 to 40dB Device IL
IL Repeatability *2, *3 (typ.)
dB
±0.02(±0.01 (typ.))
 
IL Resolution
dB
0.001
 
PDL Accuracy (typ.)
dB
±(0.02 + 3% of PDL)
0 to 20dB Device IL
±(0.15 + 3% of PDL) (typ.)
20 to 40dB Device IL
PDL Repeatability *2, *3 (typ.)
dB
±0.01
 
PDL Resolution
dB
0.01
 
Communication
USB (USB 2.0 High Speed)
MPM-200 / PCU-100 / SPU-100
GP-IB (IEEE488.2)
TSL-550 / TSL-710 / MPM-200 / PCU-100
Operating Temperature
degC
15 to 35
 
Operating Humidity
%
< 80
non-condensing

* All specifications are quoted after 1 hour warm-up period.
All specifications applies with santec optical power meter MPM-200.
*1 Temperature within 25°C±5°C
*2 Temperature within 25°C±1°C
*3 Does not include influence of connector.
*4 The measurement condition is within wavelength resolution 5pm, wavelength range 40nm for 1 channel.
*5 Measurement dynamic range per scan is up to 35dB.

 

関連製品

TSL-710

波長可変光源 TSL-710

高出力と高い信号対雑音比を両立させたsantecのフラグシップモデル
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TSL-550

NEW! 波長可変光源 TSL-550

広帯域可変が可能なsantecのマーケットリーダーモデル
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MPM-200/MPM-10

NEW! MPM-200/MPM-10

最大20portまで搭載可能なマルチ光パワーメータ
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