E-Newsletter [New products and CLEO2017]

E-Newsletter [New products and CLEO2017]

May 10, 2017
Join us at the CLEO2017 show

We’ll be unveiling a range of new instruments for optical test and measurement.


  1. SANTEC’s latest high-speed tunable laser source delivers upgrades in speed, accuracy and range, TSL-770
  2. Integrated swept laser test systems incorporating our new power meter MPM-200
  3. Spatial Light Modulator, SLM-100



Date: May 14-19,2017
Location: San Jose Convention Center
Booth: #2235

New! High Performance, High Speed tunable laser TSL-770

A ground up redesign of the laser resonator and control electronics make the TSL-770 our fastest tuning, widest scanning, lowest noise and narrowest linewidth laser ever. With models available in the 1260-1650nm range, the flexible TSL-770 is ideal choice for a wide range of applications; improving throughput, accuracy and precision in production, R&D and basic research.

  • Maximum 200nm tuning range within 1250-1650nm
  • Mode-hop-free with rapid sweeps up to 200nm/s sweeps
  • 90dB/0.1nm Signal to Source Spontaneous Emission Ratio (SSSER).
  • +13dBm (20mw) peak output power
  • 0.3pm (Typ.) Wavelength Accuracy and

santec’s Laser products lineup is here


Swept Test System

The Santec Swept Test System has been developed to streamline photonic testing, providing a complete solution where high-speed analysis, along with high resolution and accuracy are key. Combining one of Santec tunable lasers (TSL-710/ TSL-550/ TSL-510) with a Santec optical power meter (MPM-200), a polarization control unit (PCU-100) and custom software, the complete Swept Test System optimizes WDL and PDL measurement for use in both R&D and production environments.

  • Real-time power referencing
  • Rescaling algorithm
  • Multi-channel measurement is available.
  • Supporting LabVIEW control software
Swept Test System

Super-flatness of λ/40 is available in optical visible wavelength

SLM-100 (spatial light modulator) based on LCOS (Liquid Crystal on Silicon) device supports super-flatness of λ/40 @633nm using wavefront correction.


  • High resolution: 10-bit (1024 gray levels)
  • Excellent phase stability: < 0.002 π rad
  • Super-flatness: < λ/40 @633nm



Coming events

1/CLEO2017 (May 14-19, 2017)
San Jose Convention Center
Booth #2235
CLEO 2017


2/OIC2017 (June 5-7, 2017)
Hilton Santa Fe Historic Plaza Santa Fe, New Mexico USA


3/ECBO2017 (June 26-29, 2017)
Messe Munchen, Munich, Germany

General product guide 2017


To order any of our products, or to receive technical specifications,
visit our web site www.santec.com or contact us at +81-568-79-3536
If you’d like to Unsubscribe from future Santec E-Newsletters,
please respond to this message with “Unsubscribe” in the subject line.