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Optical Test Platforms

We offer a range of complete systems for measuring optical properties by combining our tunable lasers, optical switches, polarization controller, power meter and software. Please feel free to contact us for customization according to your needs.

Swept Test System for Optical Components

Swept Test System

IL / WDL / PDL measurement of optical components with fast scan, high resolution and accuracy


  • Advanced Rescaling Algorithm (High Resolution 0.1 pm)
  • Real-time Power Referencing (High Repeatability 0.02 dB)
OTF-350

Our Swept Test System is built combining Santec’s TSL series tunable lasers with multi-port power meters (MPM series) and polarization control unit (PCU-100). Our dedicated software optimizes the system for IL, WDL and PDL measurement for use in both R&D and production environments. Using real-time referencing, while simultaneously acquiring output power from the tunable laser and the transmitted optical power through the DUT, the system provides high accuracy in IL, WDL and PDL analysis using the Muller Matrix Method.

 

  • Real-time power referencing
    1. Accurate WDL/PDL characteristics measurement
    - High power repeatability <±0.02 dB
    - High PDL repeatability ±0.01 dB
  • Rescaling algorithm
    1. High wavelength resolution and accuracy
    2. Reduced measurement time
  • Multi-channel measurement is available.
  • Supporting graphical user interface and DLLs (Visual Studio)
    1. Convenient set up of measurement parameters
    2. Data analysis

WDL (Wavelength Dependent Loss) Measurement

High dynamic range measurement of 80 dB or more

The Santec tunable laser source TSL series have been outfitted with an innovative cavity design to lower the optical ASE noise, resulting in an extraordinarily high signal-to-noise ratio of over 90 dB / 0.1 nm, while also maintaining a high output power of over + 10 dBm. The TSL series lasers are ideal for next generation components testing driven by innovations in Dense Wavelength Division Multiplexing (DWDM), passives and Wavelength Selective Switches (WSS). The following graphs show the measurement data of a CWDM filter and notch filter, (such as an FBG) respectively.

80 dB以上の高ダイナミックレンジ測定
80 dB以上の高ダイナミックレンジ測定
High wavelength accuracy +/- 3 pm

The Santec tunable laser source TSL series has been equipped with the wavelength monitor as standard, so is ideal for high precision testing of optical passive components. A measurement accuracy of less than a few pm can be confirmed by measuring the absorption lines of Acetylene (12C2H2) gas cell.

高波長精度+/- 3pm
高波長精度+/- 3pm
High wavelength resolution less than 0.1 pm

The Santec Swept Test System can measure not only WDL measurements of optical components (including Dense Wavelength Division Multiplexing (DWDM), AWG, Wavelength Selective Switches (WSS) and more), but also very narrow filters (i.e., High Q cavity devices) efficiently with high resolution, even during continuous sweeps.

0.1pm未満の高波長分解能 
  • Optical characterization of components and modules:
    - Tunable Filters, Interleavers, Fiber Bragg Gratings, Couplers, Splitters, Isolators, Switches, etc
    - WSS and Wavelength Blockers
    - DWDM components
  • Silicon photonic material characterization, including micro-cavity ring resonators
  • Spectroscopy
  • Interferometry

 

Polarization Dependent Loss Measurement

1/ Polarization Dependent Loss measurement

    • Tunable Laser TSL-710/TSL-550
    • Polarization Controller PCU-100
    • Optical Power Meter MPM-210

Wavelength Dependent Loss Measurement (MPM-210)

2/ Wavelength Dependent Loss measurement (MPM-210)

  • Tunable Laser TSL-710 / TSL-550
  • Optical Power Meter MPM-210
Wavelength Dependent Loss Measurement (with any power meter)

3/ Wavelength Dependent Loss measurement (Any other power meter)
  • Tunable Laser TSL-710/TSL-550
  • Swept Processing Unit SPU-100
  • Optical Power Meter (Needs data logging function)

Software support
  • Agilent 816X A / B, 774X A Optical Power Meter
  • Photo Detector

Please feel free to contact us for customization according to your needs.

 
Parameter
Unit
Specifications
Notes
TSL-550
TSL-710
Type A
Type C
Wavelength Accuracy *1 (typ.) (Absolute)
pm
± 16
± 4.6
± 2.4
at 10 nm/s
± 19
± 7.2
± 5.0
at40 nm/s
Wavelength Accuracy (typ.) (Relative)
pm
± 9
± 3.1
± 1.6
at 10 nm/s
± 12
± 5.7
± 4.2
at 40 nm/s
Wavelength Repeatability *2
pm
± 6
± 1.9
± 1.0
at 10 nm/s
± 7
± 3.5
± 2.6
at 40 nm/s
Scan Speed
nm/s
1 to 100
1 to 100
0.5 to 100
 
Dynamic Range for Insertion Loss (typ.)
dB
70
 
Dynamic Range for PDL (typ.)
dB
0 to 5
 
Measurement Time for IL (typ.)
sec
4
at 40 nm/s *4, *5
Measurement Time for IL / PDL (typ.)
sec
14
at 40 nm/s *4, *5
Wavelength Resolution
pm
1
0.1
0.1
 
IL Accuracy (typ.)
dB
± 0.02
0 to 20 dB Device IL
± 0.03
20 to 40 dB Device IL
IL Repeatability *2, *3 (typ.)
dB
± 0.02(± 0.01 (typ.))
 
IL Resolution
dB
0.001
 
PDL Accuracy (typ.)
dB
±(0.02 + 3 % of PDL)
0 to 20 dB Device IL
±(0.15 + 3 % of PDL) (typ.)
20 to 40 dB Device IL
PDL Repeatability *2, *3 (typ.)
dB
± 0.01
 
PDL Resolution
dB
0.01
 
Communication
USB (USB 2.0 High Speed)
MPM-210 / PCU-100 / SPU-100
GP-IB (IEEE488.2)
TSL-550 / TSL-710 / MPM-210 / PCU-100
Operating Temperature
°C
15 to 35
 
Operating Humidity
%
< 80
non-condensing

* All specifications are quoted after 1 hour warm-up period.
   All specifications are applied with Santec optical power meter MPM-210.
*1 Temperature within 25°C ± 5°C
*2 Temperature within 25°C ± 1°C
*3 Does not include influence of connector.
*4 The measurement condition is within wavelength resolution 5 pm, wavelength range 40 nm for 1 channel.
*5 Measurement dynamic range per scan is up to 40 dB.

- Brochure -

If you require an operation manual, please download from here.

- Control Software -

If you require GUI software and drivers, please download from here.

Multi-channel Optical Power Meter for Swept Test System

MPM-210 / MPM-211, 212, 213

The perfect tool for very fast simultaneous measurement of multi-port optical devices

  • High Speed Measurement
    (Up to 1 million logging sampling points per port)
  • Power Meter Module (MPM-211 / 212)
  • Current Meter Module (MPM-213)
  • Up to 20-Port Measurement
MPM-210
MPM-210

Our MPM-210 is ideal for IL, WDL and PDL measurement of multi-port optical components including Dense Wavelength Division Multiplexing (DWDM), Arrayed Waveguide Gratings(AWG) , Wavelength Selective Switches (WSS) and more. When combined with our TSL-Series laser equipped with a power monitor output, the MPM-210 allows the user to complete real-time high precision IL measurements.

  • High speed measurement
    - 15 times faster data transfer than the previous Swept Test System
    - Up to 1 million logging sampling points per port
       2 memory buffers per port
    - Fast measurement (100 kHz) with high resolution
  • High dynamic range (logging mode)
    - 1.5 times higher than the previous Swept Test System (typically 50 dB)
  • Wavelength Range 1250 to 1650 nm
  • Power meter module (MPM-211 / 212)
    Dynamic power range - 80 to + 10 dBm
  • Current meter module (MPM-213)
    Dynamic current range - 70 to + 10 dBmA
  • Up to 20-port measurement
  • Analog output (MPM-212)
 
Main frame, MPM-210
Parameter
Unit
Specifications
Notes
Module Number
Up to 5
 
Interface For Power Meter
GP-IB, Ethernet, RS-232C
 
For System
USB
 
Trigger Input
TTL (3.3 V)
BNC
Trigger Output
TTL (3.3 V)
BNC
Power Monitor
V
0 to 3
BNC
Supply Voltage
V
AC 100 to 240, 50 / 60 Hz
 
Maximum Power Consumption
W
50
 
Operating Temperature
degC
10 to 40
 
Operating Humidity
%
< 80
non condensing
Weight
kg
6
 
Dimensions (W) x (D) x (H)
mm
210 x 350 x 133
 
Power Meter Module, MPM-211(4ch), MPM-212(2ch)
Parameter
Unit
MPM-211
MPM-212
Notes
Sensor Element
InGaAs
 
Wavelength Range
nm
1250 to 1680
 
Specification Wavelength Range
nm
1250 to 1630
 
Power Dynamic Range
dBm
- 80 to + 10
 
Maximum Safe Power
dBm
+ 16
 
Total Uncertainty
%
+/- 5 @- 60 to 9 dBm
 
Power Resolution
dB
0.001
 
Linearity *1
dB
+/- 0.03 @- 55 to 9 dBm
Averaging time > 100 ms
Polarization Dependent Responsivity (typ.) *1, 2
dB
< 0.025
@1525 to 1585 nm
< 0.03
@1270 to 1630 nm
Averaging Time
sec
10 μ to 10
 
Port Number per Module
4 ports
2 ports
 
Analog Output *3  
None
With (2 ports)
 
Data Logging Capability
1,000,000 x 2 buffer per port
 
Connector Type
FC
 
Operating Temperature
degC
10 to 40
 
Operating Humidity
%
< 80
non condensing
Dimensions (W) x (D) x (H)
mm
30.3 x 183.5 x 114.8
Connectors are not included.

*1: Temperature: 23 +/- 5 deg C,
*2: SMF, Straight connector
*3: Output voltage 0 to 2 V, Measurement dynamic range > 30 dB (typ.)

Current Meter Module, MPM-213
Parameter
Unit
New model, MPM-213
Notes
Current dynamic Range
dBmA
- 70 to + 10 @100 pA to 10 mA
 
Maximum Safe Power
dBmA
16
 
Total Uncertainty
%
+/- 5 @- 45 to 9 dBm
Averaging time > 10 ms
+/- 1 @>- 35 dBm (typ.)
Averaging time > 10 ms
Power Resolution
dB
0.001
 
Linearity
dB
+/- 0.03
@- 45 to + 9 dBmA, Averaging time > 10 ms
Averaging Time
sec
10 μ to 10
 
Port Number per Module
4 ports
 
Data Logging Capability
1,000,000 per port x 2
 
Connector Type
BNC Connecter
 
Reverse Bias Voltage
V
 
Operating Temperature
degC
10 to 40
 
Operating Humidity
%
< 80
non condensing
Dimensions (W) x (D) x (H)
mm
30.3 x 183.5 x 114.8
Connectors are not included.

- Brochure -

If you require an operation manual, please download from here.

- Control Software -

If you require GUI software and drivers, please download from here.

Multi-Photodetector Array

MPA-100

MPA-100 is a highly integrated rack mounted pigtailed photo-detector array.

1/10 Per-channel cost compared with typical optical power meters.

  • By packing more into the MPA-100 and sharing electrical circuitry provides excellent cost-performance compare with standard multiple optical power meters. 
1/10 Smaller footprint compared with typical optical power meters
  • Leveraging Santec arrayed photo detector technology, we save you space in this rack mounted system.

 

MPA-100
MPA-100

MPA-100 is a highly integrated rack mountable model of pigtailed photo-detectors. Multi-channel optical power from MPO or MTP connectors are measured. Photo-detectors of Silicon type for 850 nm range and InGaAs type for 1260 - 1610 nm are available. The detected photo-current is converted into a voltage output using a 16-bit multi-channel DAQ interface. The dimensions are (W) 482.6 x (D) 430 x (H) 44 mm. The highly integrated MPA-100 is available up to 80 channels with an excellent cost performance and small footprint. The MPA-100 is useful for many 40 GbE / 100 GbE applications, such as testing and monitoring of transceivers (SR4, SR10, LR4, and ER4) for data communications, broadband / CATV, and telecommunications. Tap-PD model (Eg. a partial 5 % tapped power detection) is also available with customization.

  • Testing in Data Communications, Broadband / CATV Networks, and Telecommunication Networks
  • Monitoring in Data Center Equipment
  • Monitoring of Interconnections of Active Optical Cables

Input Power vs Output Voltage
(Example: MPA-100-10-8-IR-SM-01)

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Ordering Code
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- Brochure -

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