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Swept Test System for Optical Components

Swept Test System

IL / WDL / PDL measurement platform for optical components with a fastscan speed, high resolution and accuracy. The systemcombinesour tunable lasers, polarization controller, power meter and software.

Multi-Station Measurement

The Swept Test System combined with the Multi Branch Unit can improve the efficiency of measurements.


Swept Test System introduction video
( Multi-station measurement )

Swept Test System



Overview

Our Swept Test System is built combining Santec’s TSL series tunable lasers with multi-port power meters (MPM series) and polarization control unit (PCU-110). Our dedicated software optimizes the system for IL, WDL and PDL measurement for use in both R&D and production environments. Using real-time referencing, while simultaneously acquiring output power from the tunable laser and the transmitted optical power through the DUT, the system provides high accuracy in IL, WDL and PDL analysis using the Muller Matrix Method.






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Features & Characteristics

  • Real-time power referencing
    1. Accurate WDL/PDL characteristics measurement
    - High power repeatability <±0.02 dB
    - High PDL repeatability ±0.01 dB
  • Rescaling algorithm
    1. High wavelength resolution and accuracy
    2. Reduced measurement time
  • Multi-channel measurement is available.
  • Supporting graphical user interface and DLLs (Visual Studio)
    1. Convenient set up of measurement parameters
    2. Data analysis

Please refer to this link for details. -> STS brochure

WDL (Wavelength Dependent Loss) Measurement

High dynamic range measurement of 80 dB or more

The Santec tunable laser source TSL series have been outfitted with an innovative cavity design to lower the optical ASE noise, resulting in an extraordinarily high signal-to-noise ratio of over 90 dB / 0.1 nm, while also maintaining a high output power of over + 10 dBm. The TSL series lasers are ideal for next generation components testing driven by innovations in Dense Wavelength Division Multiplexing (DWDM), passives and Wavelength Selective Switches (WSS). The following graphs show the measurement data of a CWDM filter and notch filter, (such as an FBG) respectively.

High dynamic range measurement of 80 dB or more
High dynamic range measurement of 80 dB or more
High wavelength accuracy +/- 3 pm

The Santec tunable laser source TSL series has been equipped with the wavelength monitor as standard, so is ideal for high precision testing of optical passive components. A measurement accuracy of less than a few pm can be confirmed by measuring the absorption lines of Acetylene (12C2H2) gas cell.

High wavelength accuracy +/- 3 pm
High wavelength accuracy +/- 3 pm
High wavelength resolution less than 0.1 pm

The Santec Swept Test System can measure not only WDL measurements of optical components (including Dense Wavelength Division Multiplexing (DWDM), AWG, Wavelength Selective Switches (WSS) and more), but also very narrow filters (i.e., High Q cavity devices) efficiently with high resolution, even during continuous sweeps.

High wavelength resolution less than 0.1 pm 

 



Application

  • Optical characterization of components and modules:
    - Tunable Filters, Interleavers, Fiber Bragg Gratings, Couplers, Splitters, Isolators, Switches, etc
    - WSS and Wavelength Blockers
    - DWDM components
  • Silicon photonic material characterization, including micro-cavity ring resonators
  • Spectroscopy
  • Interferometry
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Configuration

Polarization Dependent Loss Measurement


Polarization Dependent Loss measurement

1/ Polarization Dependent Loss measurement
    • Tunable Laser TSL-770 / TSL-570
    • Polarization Controller PCU-110
    • Optical Power Meter MPM-210H

Wavelength Dependent Loss Measurement

Wavelength Dependent Loss measurement

1/ Polarization Dependent Loss measurement
  • Tunable Laser TSL-770 / TSL-570
  • Optical Power Meter MPM-210H


Multi-station Measurement

In the multi-station measurement configuration, the TSL, PCU and MBU will act as a server that splits the trigger signal and light beam to different stations. Each station will consist of a client PC and a power meter. During operation, the TSL will sweep continuously allowing each station to work independently and simultaneously with other stations. In this way, the Multi-station measurement configuration can improve the efficiency of measurements for high-accuracy characterization and analysis.Multi-station PDL System

  • Tunable Laser TSL-570
  • Polarization Controller PCU-110
  • Multi-Branch Unit MBU-100
  • Optical Power Meter MPM-210H

 




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Download

- Brochure -
Swept Test System (English)
- Operation Manual -

If you require an operation manual, please download from here.

- Control Software -

If you require GUI software and drivers, please download from here.




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