Narrow linewidth, low noise and premium performance.
Excellent Accuracy (± 2 pm) & Resolution (0.1 pm)
Narrow Linewidth < 100 kHz
Wide Tuning Range from 1480 to 1640 nm
Combining high output power with high signal-to-noise ratio makes the TSL-710 an invaluable tool for optical testing. An innovative external cavity design has been implemented to lower the optical ASE noise, leading to a signal-to-noise ratio of over 90 dB/0.1 nm, while still maintaining a high output power of over +10 dBm. The TSL-710 is available for WDL and PDL measurement with our multi-port power meters (MPM series), a polarization control unit (PCU-100) and dedicated software. (Swept Test System)
Wide tuning range from 1480 to 1640 nm If you require a diﬀerent wavelength range, please refer to the TSL-550 which offers more wavelength ranges, with options from 1260 to 1680 nm.
High wavelength accuracy: +/- 2 pm
High output power: + 13 dBm
High signal-to-noise ratio: 90 dB/0.1 nm
Narrow linewidth: 100 kHz
- Typical Data-
Optical characterization of components and modules: - Tunable Filters, Interleavers, Fiber Bragg Gratings, Couplers, Splitters, Isolators, Switches, etc - WSS and Wavelength Blockers - DWDM components
Silicon photonic material characterization, including micro-cavity ring resonators