Evolution of the Tunable Laser

Premium Performance Tunable Laser


Narrow linewidth, low noise and premium performance.

  • Excellent Accuracy (± 2 pm) & Resolution (0.1 pm)
  • Narrow Linewidth < 100 kHz
  • Wide Tuning Range from 1480 to 1640 nm



Combining high output power with high signal-to-noise ratio makes the TSL-710 an invaluable tool for optical testing. An innovative external cavity design has been implemented to lower the optical ASE noise, leading to a signal-to-noise ratio of over 90 dB/0.1 nm, while still maintaining a high output power of over +10 dBm. The TSL-710 is available for WDL and PDL measurement with our multi-port power meters (MPM series), a polarization control unit (PCU-100) and dedicated software. (Swept Test System)


Wide tuning range from 1480 to 1640 nm
If you require a different wavelength range, please refer to the TSL-550 which offers more wavelength ranges, with options from 1260 to 1680 nm.
    • High wavelength accuracy: +/- 2 pm
    • High output power: + 13 dBm
    • High signal-to-noise ratio: 90 dB/0.1 nm
    • Narrow linewidth: 100 kHz
    - Typical Data -
    Wavelength vs. Output Power
    - Wide Wavelength Range -
    –Wide Wavelength Range–


  • Optical characterization of components and modules:
    - Tunable Filters, Interleavers, Fiber Bragg Gratings, Couplers, Splitters, Isolators, Switches, etc
    - WSS and Wavelength Blockers
    - DWDM components
  • Silicon photonic material characterization, including micro-cavity ring resonators
  • Spectroscopy
  • Interferometry

    Please refer to here for details. -> Swept Test System


- Brochure -
TSL-710 (English)
- Operation Manual -
If you require an operation manual, please download from here.
- Control Software -
If you require a GUI software and the driver, please download from here.

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