Think Precise
Optical Test Platforms
We offer a range of complete systems for measuring optical properties by combining our tunable lasers, optical switches, polarization controller, power meter and software. Please feel free to contact us for customization according to your needs.
Swept Test System for Optical Components
Swept Test System
IL / WDL / PDL measurement of optical components with fast scan, high resolution and accuracy
- Advanced Rescaling Algorithm (High Resolution 0.1 pm)
- Real-time Power Referencing (High Repeatability 0.02 dB)
Our Swept Test System is built combining Santec’s TSL series tunable lasers with multi-port power meters (MPM series) and polarization control unit (PCU-100). Our dedicated software optimizes the system for IL, WDL and PDL measurement for use in both R&D and production environments. Using real-time referencing, while simultaneously acquiring output power from the tunable laser and the transmitted optical power through the DUT, the system provides high accuracy in IL, WDL and PDL analysis using the Muller Matrix Method.
- Real-time power referencing
1. Accurate WDL/PDL characteristics measurement
- High power repeatability <±0.02 dB
- High PDL repeatability ±0.01 dB - Rescaling algorithm
1. High wavelength resolution and accuracy
2. Reduced measurement time - Multi-channel measurement is available.
- Supporting graphical user interface and DLLs (Visual Studio)
1. Convenient set up of measurement parameters
2. Data analysis
WDL (Wavelength Dependent Loss) Measurement
High dynamic range measurement of 80 dB or more
The Santec tunable laser source TSL series have been outfitted with an innovative cavity design to lower the optical ASE noise, resulting in an extraordinarily high signal-to-noise ratio of over 90 dB / 0.1 nm, while also maintaining a high output power of over + 10 dBm. The TSL series lasers are ideal for next generation components testing driven by innovations in Dense Wavelength Division Multiplexing (DWDM), passives and Wavelength Selective Switches (WSS). The following graphs show the measurement data of a CWDM filter and notch filter, (such as an FBG) respectively.
High wavelength accuracy +/- 3 pm
The Santec tunable laser source TSL series has been equipped with the wavelength monitor as standard, so is ideal for high precision testing of optical passive components. A measurement accuracy of less than a few pm can be confirmed by measuring the absorption lines of Acetylene (12C2H2) gas cell.
High wavelength resolution less than 0.1 pm
The Santec Swept Test System can measure not only WDL measurements of optical components (including Dense Wavelength Division Multiplexing (DWDM), AWG, Wavelength Selective Switches (WSS) and more), but also very narrow filters (i.e., High Q cavity devices) efficiently with high resolution, even during continuous sweeps.
- Optical characterization of components and modules:
- Tunable Filters, Interleavers, Fiber Bragg Gratings, Couplers, Splitters, Isolators, Switches, etc
- WSS and Wavelength Blockers
- DWDM components - Silicon photonic material characterization, including micro-cavity ring resonators
- Spectroscopy
- Interferometry
Polarization Dependent Loss Measurement
- Tunable Laser TSL-710/TSL-550
- Polarization Controller PCU-100
- Optical Power Meter MPM-210
Wavelength Dependent Loss Measurement (MPM-210)
- Tunable Laser TSL-710 / TSL-550
- Optical Power Meter MPM-210
Wavelength Dependent Loss Measurement (with any power meter)
- Tunable Laser TSL-710/TSL-550
- Swept Processing Unit SPU-100
- Optical Power Meter (Needs data logging function)
Software support
- Agilent 816X A / B, 774X A Optical Power Meter
- Photo Detector
Please feel free to contact us for customization according to your needs.
|
Parameter
|
Unit
|
Specifications
|
Notes
|
||
|
TSL-550
|
TSL-710
|
||||
|
Type A
|
Type C
|
–
|
|||
| Wavelength Accuracy *1 (typ.) (Absolute) |
pm
|
± 16
|
± 4.6
|
± 2.4
|
at 10 nm/s |
|
± 19
|
± 7.2
|
± 5.0
|
at40 nm/s | ||
| Wavelength Accuracy (typ.) (Relative) |
pm
|
± 9
|
± 3.1
|
± 1.6
|
at 10 nm/s |
|
± 12
|
± 5.7
|
± 4.2
|
at 40 nm/s | ||
| Wavelength Repeatability *2 |
pm
|
± 6
|
± 1.9
|
± 1.0
|
at 10 nm/s |
|
± 7
|
± 3.5
|
± 2.6
|
at 40 nm/s | ||
| Scan Speed |
nm/s
|
1 to 100
|
1 to 100
|
0.5 to 100
|
|
| Dynamic Range for Insertion Loss (typ.) |
dB
|
70
|
|||
| Dynamic Range for PDL (typ.) |
dB
|
0 to 5
|
|||
| Measurement Time for IL (typ.) |
sec
|
4
|
at 40 nm/s *4, *5 | ||
| Measurement Time for IL / PDL (typ.) |
sec
|
14
|
at 40 nm/s *4, *5 | ||
| Wavelength Resolution |
pm
|
1
|
0.1
|
0.1
|
|
| IL Accuracy (typ.) |
dB
|
± 0.02
|
0 to 20 dB Device IL | ||
|
± 0.03
|
20 to 40 dB Device IL | ||||
| IL Repeatability *2, *3 (typ.) |
dB
|
± 0.02(± 0.01 (typ.))
|
|||
| IL Resolution |
dB
|
0.001
|
|||
| PDL Accuracy (typ.) |
dB
|
±(0.02 + 3 % of PDL)
|
0 to 20 dB Device IL | ||
|
±(0.15 + 3 % of PDL) (typ.)
|
20 to 40 dB Device IL | ||||
| PDL Repeatability *2, *3 (typ.) |
dB
|
± 0.01
|
|||
| PDL Resolution |
dB
|
0.01
|
|||
| Communication |
–
|
USB (USB 2.0 High Speed)
|
MPM-210 / PCU-100 / SPU-100 | ||
|
GP-IB (IEEE488.2)
|
TSL-550 / TSL-710 / MPM-210 / PCU-100 | ||||
| Operating Temperature |
°C
|
15 to 35
|
|||
| Operating Humidity |
%
|
< 80
|
non-condensing | ||
* All specifications are quoted after 1 hour warm-up period.
All specifications are applied with Santec optical power meter MPM-210.
*1 Temperature within 25°C ± 5°C
*2 Temperature within 25°C ± 1°C
*3 Does not include influence of connector.
*4 The measurement condition is within wavelength resolution 5 pm, wavelength range 40 nm for 1 channel.
*5 Measurement dynamic range per scan is up to 40 dB.
Multi-channel Optical Power Meter for Swept Test System
MPM-210 / MPM-211, 212, 213
The perfect tool for very fast simultaneous measurement of multi-port optical devices- High Speed Measurement
(Up to 1 million logging sampling points per port) - Power Meter Module (MPM-211 / 212)
- Current Meter Module (MPM-213)
- Up to 20-Port Measurement
Our MPM-210 is ideal for IL, WDL and PDL measurement of multi-port optical components including Dense Wavelength Division Multiplexing (DWDM), Arrayed Waveguide Gratings（AWG) , Wavelength Selective Switches (WSS) and more. When combined with our TSL-Series laser equipped with a power monitor output, the MPM-210 allows the user to complete real-time high precision IL measurements.
- High speed measurement
- 15 times faster data transfer than the previous Swept Test System
- Up to 1 million logging sampling points per port
2 memory buffers per port
- Fast measurement (100 kHz) with high resolution - High dynamic range (logging mode)
- 1.5 times higher than the previous Swept Test System (typically 50 dB) - Wavelength Range 1250 to 1650 nm
- Power meter module (MPM-211 / 212)
Dynamic power range - 80 to + 10 dBm - Current meter module (MPM-213)
Dynamic current range - 70 to + 10 dBmA - Up to 20-port measurement
- Analog output (MPM-212)
- Optical power measurements
- IL, WDL and PDL measurements (Swept Test System)
Main frame, MPM-210
|
Parameter
|
Unit
|
Specifications
|
Notes
|
|
| Module Number |
–
|
Up to 5
|
||
| Interface | For Power Meter |
–
|
GP-IB, Ethernet, RS-232C
|
|
| For System |
–
|
USB
|
||
| Trigger Input |
–
|
TTL (3.3 V)
|
BNC
|
|
| Trigger Output |
–
|
TTL (3.3 V)
|
BNC
|
|
| Power Monitor |
V
|
0 to 3
|
BNC
|
|
| Supply Voltage |
V
|
AC 100 to 240, 50 / 60 Hz
|
||
| Maximum Power Consumption |
W
|
50
|
||
| Operating Temperature |
degC
|
10 to 40
|
||
| Operating Humidity |
%
|
< 80
|
non condensing
|
|
| Weight |
kg
|
6
|
||
| Dimensions (W) x (D) x (H) |
mm
|
210 x 350 x 133
|
||
Power Meter Module, MPM-211(4ch), MPM-212(2ch)
|
Parameter
|
Unit
|
MPM-211
|
MPM-212
|
Notes
|
| Sensor Element |
–
|
InGaAs
|
||
| Wavelength Range |
nm
|
1250 to 1680
|
||
| Specification Wavelength Range |
nm
|
1250 to 1630
|
||
| Power Dynamic Range |
dBm
|
- 80 to + 10
|
||
| Maximum Safe Power |
dBm
|
+ 16
|
||
| Total Uncertainty |
%
|
+/- 5 @- 60 to 9 dBm
|
||
| Power Resolution |
dB
|
0.001
|
||
| Linearity *1 |
dB
|
+/- 0.03 @- 55 to 9 dBm
|
Averaging time > 100 ms
|
|
| Polarization Dependent Responsivity (typ.) *1, 2 |
dB
|
< 0.025
|
@1525 to 1585 nm
|
|
|
< 0.03
|
@1270 to 1630 nm
|
|||
| Averaging Time |
sec
|
10 μ to 10
|
||
| Port Number per Module |
–
|
4 ports
|
2 ports
|
|
| Analog Output *3 |
None
|
With (2 ports)
|
||
| Data Logging Capability |
–
|
1,000,000 x 2 buffer per port
|
||
| Connector Type |
–
|
FC
|
||
| Operating Temperature |
degC
|
10 to 40
|
||
| Operating Humidity |
%
|
< 80
|
non condensing
|
|
| Dimensions (W) x (D) x (H) |
mm
|
30.3 x 183.5 x 114.8
|
Connectors are not included.
|
|
*1: Temperature: 23 +/- 5 deg C,
*2: SMF, Straight connector
*3: Output voltage 0 to 2 V, Measurement dynamic range > 30 dB (typ.)
Current Meter Module, MPM-213
|
Parameter
|
Unit
|
New model, MPM-213
|
Notes
|
| Current dynamic Range |
dBmA
|
- 70 to + 10 @100 pA to 10 mA
|
|
| Maximum Safe Power |
dBmA
|
16
|
|
| Total Uncertainty |
%
|
+/- 5 @- 45 to 9 dBm
|
Averaging time > 10 ms
|
|
+/- 1 @>- 35 dBm (typ.)
|
Averaging time > 10 ms
|
||
| Power Resolution |
dB
|
0.001
|
|
| Linearity |
dB
|
+/- 0.03
|
@- 45 to + 9 dBmA, Averaging time > 10 ms
|
| Averaging Time |
sec
|
10 μ to 10
|
|
| Port Number per Module |
–
|
4 ports
|
|
| Data Logging Capability |
–
|
1,000,000 per port x 2
|
|
| Connector Type |
–
|
BNC Connecter
|
|
| Reverse Bias Voltage |
V
|
–
|
|
| Operating Temperature |
degC
|
10 to 40
|
|
| Operating Humidity |
%
|
< 80
|
non condensing
|
| Dimensions (W) x (D) x (H) |
mm
|
30.3 x 183.5 x 114.8
|
Connectors are not included.
|
Multi-Photodetector Array
MPA-100
MPA-100 is a highly integrated rack mounted pigtailed photo-detector array.
1/10 Per-channel cost compared with typical optical power meters.
- By packing more into the MPA-100 and sharing electrical circuitry provides excellent cost-performance compare with standard multiple optical power meters.
- Leveraging Santec arrayed photo detector technology, we save you space in this rack mounted system.
MPA-100 is a highly integrated rack mountable model of pigtailed photo-detectors. Multi-channel optical power from MPO or MTP connectors are measured. Photo-detectors of Silicon type for 850 nm range and InGaAs type for 1260 - 1610 nm are available. The detected photo-current is converted into a voltage output using a 16-bit multi-channel DAQ interface. The dimensions are (W) 482.6 x (D) 430 x (H) 44 mm. The highly integrated MPA-100 is available up to 80 channels with an excellent cost performance and small footprint. The MPA-100 is useful for many 40 GbE / 100 GbE applications, such as testing and monitoring of transceivers (SR4, SR10, LR4, and ER4) for data communications, broadband / CATV, and telecommunications. Tap-PD model (Eg. a partial 5 % tapped power detection) is also available with customization.
- Testing in Data Communications, Broadband / CATV Networks, and Telecommunication Networks
- Monitoring in Data Center Equipment
- Monitoring of Interconnections of Active Optical Cables
Input Power vs Output Voltage
(Example: MPA-100-10-8-IR-SM-01)
Ordering Code