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Measurement range extended “Swept Photonics Analyzer” delivers on wafer silicon photonics testing and easy probe alignment.

Product Name: Swept Photonics Analyzer
Model: SPA-110

Santec Holdings Corporation, a leading manufacturer of advanced optical components, tunable lasers, optical test equipment, and OCT systems, announces the product launch of the extended range Swept Photonics Analyzer (SPA-110). The SPA-110, in conjunction with Santec’s market leading tunable laser, uses optical frequency domain reflectometry (OFDR) technology to analyze compact fiber optic and photonic devices for insertion loss and return loss with a spatial resolution of better than 5 μm.
The SPA-110 builds on Santec’s predecessor, the SPA-100, by extending the total measurement range from 5 m to 30 m. This increased range accommodates the addition of optical signal conditioning devices, such as polarization controllers and optical switches, within the fiber optic setup. This enhancement makes the system particularly suitable for more comprehensive characterization of small devices like silicon photonic circuits, fiber optic components, and compact fiber optic assemblies.
Furthermore, the extended scan length allows for the analysis of longer fiber optic cable assemblies with closely spaced components, where OTDR technology might struggle to distinguish between them.
Finally, the 80 dB dynamic range during Wavelength Dependent Loss measurement (WDL) make it possible to detect even weaker reflection events.

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Features:
・ 30 m measurement range makes it ideal for integration into photonics devices testing systems.
・ High Spatial Resolution: <5 μm spatial resolution in silicon
・ Wide Dynamic Range for WDL: better than 80 dB dynamic range for WDL measurements
・ Auxiliary OPM port: Integrate external OPM to facilitate automated alignment to waveguide
・ Configurable: O-band and CL band options
・ Proximity sensing: Use OFDR technology to sense distance between fiber probe and wafer
・ Easy Analysis: Intuitive software to analyze areas of interest, apply different refractive indexes to portions of the scan, measure IL and RL, store/load previous data for further analysis.

The SPA-110 will be exhibited at our booth #10A52 at the CIOE 2024 exhibition to be held in Shenzhen, China from September 11th.



About Santec:
Santec Holdings Corporation (the “Santec”) was established in 1979. It is headquartered in Komaki, Aichi, Japan and has subsidiaries in Japan (Santec AOC Corporation, Santec LIS Corporation, Santec OIS Corporation and Santec Japan Corporation), in North America (Santec Global Corporation in NJ, Santec U.S.A. Corporation in NJ, Santec Canada Corporation in Ottawa and Santec California Corporation in CA), U.K. (Santec Europe Ltd. in Oxfordshire) and China (Santec (Shanghai) Co., Ltd. in Shanghai). Santec is listed on the Standard Market (6777) a section of the Tokyo Stock Exchange. The company employs 293 staff members and serves a global customer base; including the world’s major telecommunications companies, transmission/sub system manufacturers, internationally recognized research centers and universities. Santec’s product lines include a broad range of advanced optical components, tunable lasers, optical test/measurement and OCT systems for telecommunication, life science, sensing and industry applications.