Santec Launches Advanced OFDR - Bringing Micron-Level Precision to Optical Fiber and Photonic Device Testing
— Featuring a 250 m measurement range, 5 µm spatial resolution, and a polarization-independent detector to significantly enhance optical fiber cable assembly testing —
Product Name: Swept Photonics Analyzer
Model: SPA-200
santec LIS Corporation (Komaki, Aichi, Japan) announces the launch of its latest product, the Swept Photonics Analyzer “SPA‑200” based on Optical Frequency Domain Reflectometry (OFDR) technology. The SPA‑200 is an advanced analytical instrument that enables highly accurate detection of reflection points and defect locations, precise measurement of minute losses, and characterization of waveguide propagation loss—capabilities essential for optical fiber cable assembly and photonics device testing.
With the SPA-200, the maximum measurement range has been extended to 250 meters, more than eight times that of the previous model (SPA-110), enabling inspection of long optical fiber cable assemblies and complex photonic systems. In addition, the SPA-200 incorporates a newly developed polarization-independent detector, which significantly improves loss measurement accuracy for non-polarization-maintaining devices, ensuring higher measurement reproducibility and reliability.
Despite the substantial extension of the measurement range, the SPA‑200 maintains the same high spatial resolution of 5 µm as the previous model. These capabilities make the SPA-200 a powerful tool for applications ranging from silicon photonics and integrated photonic device research to optical cable assembly testing and automated test systems used in volume manufacturing environments.
Key Features:
- Long Measurement Range of 250 m
With a maximum measurement range of up to 250 meters—more than eight times that of the previous model (SPA‑110)—the SPA‑200 supports inspection of long optical fiber cable assemblies.
- High Spatial Resolution of 5 µm
Even with the significantly extended measurement range, the SPA‑200 maintains a high spatial resolution of 5 µm, enabling accurate evaluation of minute reflection points and loss factors.
- High-Accuracy Loss Measurement with a Polarization-Independent Detector
A newly developed polarization-independent detector reduces measurement variation in non-polarization-maintaining devices, significantly improving loss measurement accuracy.
- Optimized for Silicon Photonics
Supporting precise small-loss measurements and waveguide propagation loss characterization, the SPA‑200 can be utilized across a wide range of applications—from research and development to production processes.
The SPA-200 is scheduled to be available for order in April 2026.
Exhibition Information:
The SPA‑200 will be exhibited at OFC 2026, to be held in Los Angeles, USA, starting March 17, 2026.
Booth: #1029
■ About Santec LIS Corporation
Santec LIS Corporation is a subsidiary of Santec Holdings Corporation, a leading provider of advanced optical technologies. Santec Holdings Corporation (TSE Standard: 6777) was founded in 1979 and is headquartered in Komaki, Aichi, Japan. The company has subsidiaries in Japan, North America, the United Kingdom, and China, serving a global customer base, including major telecommunications companies, optical subsystem manufacturers, and leading research institutions.
Santec’s product lines include advanced optical components, tunable lasers, optical test & measurement systems, and OCT systems for applications in telecommunications, life sciences, sensing, and industrial fields. The company employs approximately 350 people worldwide.

















